2 산물
| 그림 | 모델 | 가격 | 양 | 재고 | 제조사 | 기술 | Package / Case | Series | Packaging | Mounting Type | Part Status | Voltage - Supply | Supplier Device Package | Applications | Interface | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
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전망 | Texas Instruments | IC ABT SCAN TEST DEV 3.3V 64LQFP | 64-LQFP | SCOPE™, Widebus™ | Tape & Reel (TR) | Surface Mount | Obsolete | 2.7 V ~ 3.6 V | 64-LQFP (10x10) | Circuit Board Testing | 4-Wire Test Access Port (TAP) | |||
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전망 | Texas Instruments | IC ABT SCAN TEST DEV 3.3V 64LQFP | 64-LQFP | SCOPE™, Widebus™ | Tape & Reel (TR) | Surface Mount | Obsolete | 2.7 V ~ 3.6 V | 64-LQFP (10x10) | Circuit Board Testing | 4-Wire Test Access Port (TAP) |
